Measurement errors in entanglement-assisted electron microscopy
arXiv:1401.7410 · doi:10.1103/PhysRevA.89.063828
Abstract
The major resolution-limiting factor in cryoelectron microscopy of unstained biological specimens is radiation damage by the very electrons that are used to probe the specimen structure. To address this problem, an electron microscopy scheme that employs quantum entanglement to enable phase measurement precision beyond the standard quantum limit has recently been proposed {[}Phys. Rev. A \textbf{85}, 043810{]}. Here we identify and examine in detail measurement errors that will arise in the scheme. An emphasis is given to considerations concerning inelastic scattering events because in general schemes assisted with quantum entanglement are known to be highly vulnerable to lossy processes. We find that the amount of error due both to elastic and inelastic scattering processes are acceptable provided that the electron beam geometry is properly designed.
45 pages, 4 figures; See also arXiv1311.2377
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