Resilient quantum electron microscopy
arXiv:2001.05603 · doi:10.1103/PhysRevA.106.022605
Abstract
We investigate the fundamental limit of biological quantum electron microscopy, which is designed to go beyond the shot noise limit. Inelastic scattering is expected to be the main obstacle in this setting, especially for thick specimens of actual biological interest. Here we describe a measurement procedure that, in principle, significantly neutralizes the effect of inelastic scattering.
27 pages, 4 figures, 2 tables; fully rewritten and some changes in definitions of symbols
References in corpus (7)
- Thon rings from amorphous ice and implications of beam-induced Brownian motion in single particle electron cryo-microscopy
- Semitransparency in interaction-free measurements
- Entanglement-assisted electron microscopy based on a flux qubit
- A quantum mechanical scheme to reduce radiation damage in electron microscopy
- Reduced damage in electron microscopy by using interaction-free measurement and conditional re-illumination
- Measurement errors in entanglement-assisted electron microscopy
- A quantum interface to charged particles in a vacuum