Long-range Scanning Tunneling Microscope for the study of nanostructures on insulating substrates

Abstract

The Scanning Tunneling Microscope is a powerful tool for studying the electronic properties at the atomic level, however it's relatively small scanning range and the fact that it can only operate on conducting samples prevents its application to study heterogeneous samples consisting on conducting and insulating regions. Here we present a long-range scanning tunneling microscope capable of detecting conducting micro and nanostructures on insulating substrates using a technique based on the capacitance between the tip and the sample and performing STM studies.

3 pages, 7 figures

References in corpus (5)

• Atomic Structure of Graphene on SiO2
• High-Resolution Scanning Tunneling Microscopy Imaging of Mesoscopic Graphene Sheets on an Insulating Surface
• Intrinsic and extrinsic corrugation of monolayer graphene deposited on SiO2
• Room-temperature gating of molecular junctions using few-layer graphene nanogap electrodes
• Carbon fibre tips for scanning probe microscopy based on quartz tuning fork force sensors

Cited by in corpus (2)

• Electronic bandgap and exciton binding energy of layered semiconductor TiS3
• Fabrication of hybrid molecular devices using multi-layer graphene break junctions