The pionic Drell-Yan process: a brief survey
arXiv:1306.3971 · doi:10.1142/S0218301313300208
Abstract
The Drell-Yan process is an invaluable tool for probing the structure of hadrons, and the pion-induced Drell-Yan process is unique in its sensitivity to several subtleties of the partonic structure. This is a brief review of the pionic Drell-Yan process with particular emphasis on the dilepton angular distributions and nuclear modification of the parton distributions (the EMC effect).
15 pages, 6 figures, to appear in IJMPE
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Cited by in corpus (15)
- The Challenge of the EMC Effect: existing data and future directions
- Novel Phenomenology of Parton Distributions from the Drell-Yan Process
- Pion TMDs in light-front constituent approach, and Boer-Mulders effect in the pion-induced Drell-Yan process
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