Quadrature phase interferometer for high resolution force spectroscopy
arXiv:1306.0871 · doi:10.1063/1.4819743
Abstract
In this article, we present a deflection measurement setup for Atomic Force Microscopy (AFM). It is based on a quadrature phase differential interferometer: we measure the optical path difference between a laser beam reflecting above the cantilever tip and a reference beam reflecting on the static base of the sensor. A design with very low environmental susceptibility and another allowing calibrated measurements on a wide spectral range are described. Both enable a very high resolution (down to $\SI{2.5E-15}{m/\sqrt{Hz}}$), illustrated by thermal noise measurements on AFM cantilevers. They present an excellent long-term stability, and a constant sensitivity independent of the optical phase of the interferometer. A quick review shows that our precision is equaling or out-performing the best results reported in the literature, but for a much larger deflection range, up to a few $\SI{}{\micro m}$.
References in corpus (5)
- Frequency dependence of viscous and viscoelastic dissipation in coated micro-cantilevers from noise measurement
- Functionalized AFM probes for force spectroscopy: eigenmodes shape and stiffness calibration through thermal noise measurements
- Dissipation of micro-cantilevers as a function of air pressure and metallic coating
- Thermal noise of microcantilevers in viscous fluids
- Single beam interferometric angle measurement
Cited by in corpus (29)
- A micromechanical proof-of-principle experiment for measuring the gravitational force of milligram masses
- Information and thermodynamics: fast and precise approach to Landauer's bound in an underdamped micro-mechanical oscillator
- Fast equilibrium switch of a micro mechanical oscillator
- Dynamics of information erasure and extension of Landauer's bound to fast processes
- Measurements of mechanical thermal noise and energy dissipation in optical dielectric coatings
- Material loss angles from direct measurements of broadband thermal noise
- Resonance frequency shift of strongly heated micro-cantilevers
- Low thermal fluctuations in a system heated out of equilibrium
- Landauer Principle and Thermodynamics of Computation
- Adhesion energy of single wall carbon nanotube loops on various substrates
- Adiabatic computing for optimal thermodynamic efficiency of information processing
- Silicon cantilevers locally heated from 300K up to the melting point: temperature profile measurement from their resonances frequency shift
- Learning efficient erasure protocols for an underdamped memory
- Inertial effects in discrete sampling information engines
- Probabilistic work extraction on a classical oscillator beyond the second law
- Thermo-optical bistability in silicon micro-cantilevers
- High Resolution Viscosity Measurement by Thermal Noise Detection
- Reliability and operation cost of underdamped memories during cyclic erasures
- Harmonic calibration of quadrature phase interferometry
- Thermal noise of a cryo-cooled silicon cantilever locally heated up to its melting point
- Information engine fueled by first-passage times
- Dynamic stiffness of the contact between a carbon nanotube and a flat substrate in a peeling geometry
- Force microscopy cantilevers locally heated in a fluid: temperature fields and effects on the dynamics
- Temperature mediated back-action in micro- and nanomechanical resonators
- Logical and thermodynamical reversibility: optimized experimental implementation of the NOT operation
- Virtual potential created by a feedback loop: taming the feedback demon to explore stochastic thermodynamics of underdamped systems
- Calibrated force measurement in Atomic Force Microscopy using the Transient Fluctuation Theorem
- Virtual double-well potential for an underdamped oscillator created by a feedback loop
- Thermal noise calibration of functionalized cantilevers for force microscopy: effects of the colloidal probe position