Shifts of optical frequency references based on spectral-hole burning in Eu:Y2SiO5
arXiv:1210.4458 · doi:10.1088/1367-2630/15/3/033006
Abstract
Several properties of Eu:Y2SiO5 spectral holes are measured, to assess the suitability of broad-band hole-patterns for use as laser-frequency references. We measure frequency shifts due to magnetic fields, side-features of neighboring spectral holes, and changing optical probe power. A precise calibration of a temperature insensitive point is also performed, where the temperature-induced frequency shift is canceled to first order by the pressure-induced shift from the crystal's helium-gas environment.
12 pages, 6 figures
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