1/f noise of Josephson-junction-embedded microwave resonators at single photon energies and millikelvin temperatures
arXiv:1112.3584 · doi:10.1063/1.3700964
Abstract
We present measurements of 1/f frequency noise in both linear and Josephson-junction-embedded superconducting aluminum resonators in the low power, low temperature regime - typical operating conditions for superconducting qubits. The addition of the Josephson junction does not result in additional frequency noise, thereby placing an upper limit for fractional critical current fluctuations of (Hz) at 1 Hz for sub-micron, shadow evaporated junctions. These values imply a minimum dephasing time for a superconducting qubit due to critical current noise of 40 -- 1400 s depending on qubit architecture. Occasionally, at temperatures above 50 mK, we observe the activation of individual fluctuators which increase the level of noise significantly and exhibit Lorentzian spectra.
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- Generalized Tunneling Model for TLS in amorphous materials and its predictions for their dephasing and the noise in superconducting microresonators
- Robust manipulation of superconducting qubits in the presence of fluctuations
- Low frequency resistance and critical current fluctuations in Al-based Josephson junctions
- Low temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits
- Exact decoherence dynamics of noise
- Hybrid cat-transmon architecture for scalable, hardware-efficient quantum error correction