Low temperature 1/f noise in microwave dielectric constant of amorphous dielectrics in Josephson qubits

Abstract

The accurate analytical solution for the low temperature $1/f$ noise in a microwave dielectric constant of amorphous films containing tunneling two-level systems (TLSs) is derived within the standard tunneling model including the weak dipolar or elastic TLS-TLS interactions. The results are consistent with the recent experimental investigations of $1/f$ noise in Josephson junction qubits including the power law increase of the noise amplitude with decreasing temperature at low temperatures $T<0.1$K. The long time correlations needed for $1/f$ noise are provided by the logarithmic broadening of TLS absorption resonances with time due to their interaction with neighboring TLSs. The noise behavior at higher temperatures $T>0.1$K and its possible sensitivity to quasi-particle excitations are discussed.

5 pages, two figures

References in corpus (4)

• Superconducting Circuits and Quantum Information
• Generalized Tunneling Model for TLS in amorphous materials and its predictions for their dephasing and the noise in superconducting microresonators
• Saturation of Two Level Systems and Charge Noise in Josephson Junction Qubits
• Slow noise processes in superconducting resonators

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