Diodes with Breakdown Voltages Enhanced by the Metal-Insulator Transition of LaAlO-SrTiO Interfaces
arXiv:1005.0941 · doi:10.1063/1.3428433
Abstract
Using the metal-insulator transition that takes place as a function of carrier density at the LaAlO-SrTiO interface, oxide diodes have been fabricated with room-temperature breakdown voltages of up to 200 V. With applied voltage, the capacitance of the diodes changes by a factor of 150. The diodes are robust and operate at temperatures up to 270 C.
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Cited by in corpus (9)
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