Stability of exfoliated Bi${}_2$Sr${}_2$Dy${}_x$Ca${}_{1-x}$Cu${}_2$O${}_{8+\delta }$ studied by Raman microscopy

Abstract

Nanometer thick cuprates are an appealing platform for devices as well as exploring the roles of dimensionality, disorder, and free carrier density in these compounds. To this end we have produced exfoliated crystals of Bi2Sr2CaCu2O8 on oxidized silicon substrates. The exfoliated crystals were characterized via Atomic Force and polarized Raman microscopies. Proper procedures for production, handling and monitoring of these thin oxides are described. Subtle differences between the exfoliated and bulk crystals are also discussed.

8 pages, 6 figures

References in corpus (7)

• Two Dimensional Atomic Crystals
• Making graphene visible
• Measurement of Scattering Rate and Minimum Conductivity in Graphene
• Inelastic Light Scattering From Correlated Electrons
• Interference effect on Raman spectrum of graphene on SiO_2/Si
• Evidence of ion diffusion at room temperature in microcrystals of the Bi2Sr2CaCu2O8+delta superconductor
• Doping dependence of phonon and quasiparticle heat transport of pure and Dy-doped Bi_2Sr_2CaCu_2O_{8+δ} single crystals

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• Nanoelectromechanical resonators from high-T${}_c$ superconducting crystals of Bi${}_2$Sr${}_2$Ca${}_1$Cu${}_2$O${}_{8+\delta }$
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