Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging

Abstract

Coherent diffraction imaging (CDI) on Bragg reflections is a promising technique for the study of three-dimensional (3D) composition and strain fields in nanostructures, which can be recovered directly from the coherent diffraction data recorded on single objects. In this article we report results obtained for single homogeneous and heterogeneous nanowires with a diameter smaller than 100 nm, for which we used CDI to retrieve information about deformation and faults existing in these wires. The article also discusses the influence of stacking faults, which can create artefacts during the reconstruction of the nanowire shape and deformation.

18 pages, 6 figures Submitted to New Journal of Physics

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Cited by in corpus (6)

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• Free log-likelihood as an unbiased metric for coherent diffraction imaging
• Three-dimensional coherent Bragg imaging of rotating nanoparticles
• Correlated nanoscale analysis of the emission from wurtzite versus zincblende (In,Ga)As/GaAs nanowire core-shell quantum wells
• Time-dependent relaxation of strained silicon-on-insulator lines using a partially coherent x-ray nanobeam