Inversion of the Diffraction Pattern from an Inhomogeneously Strained Crystal using an Iterative Algorithm

Abstract

The displacement field in highly non uniformly strained crystals is obtained by addition of constraints to an iterative phase retrieval algorithm. These constraints include direct space density uniformity and also constraints to the sign and derivatives of the different components of the displacement field. This algorithm is applied to an experimental reciprocal space map measured using high resolution X-ray diffraction from an array of silicon lines and the obtained component of the displacement field is in very good agreement with the one calculated using a finite element model.

5 pages, 4 figures

References in corpus (2)

• X-ray image reconstruction from a diffraction pattern alone
• A unified evaluation of iterative projection algorithms for phase retrieval

Cited by in corpus (6)

• Analysis of strain and stacking faults in single nanowires using Bragg coherent diffraction imaging
• Fast computing of scattering maps of nanostructures using graphical processing units
• Selective coherent x-ray diffractive imaging of displacement fields in (Ga,Mn)As/GaAs periodical wires
• Improved success rate and stability for phase retrieval by including randomized overrelaxation in the hybrid input output algorithm
• Retrieval of the atomic displacements in the crystal from the coherent x-ray diffraction pattern
• A coherent way to image dislocations