Conductance asymmetry of a slot gate Si-MOSFET in a strong parallel magnetic field
arXiv:0909.1491 · doi:10.1002/andp.200910400
Abstract
We report measurements on a Si-MOSFET sample with a slot in the upper gate, allowing for different electron densities n_{1,2} across the slot. The dynamic longitudinal resistance was measured by the standard lock-in technique, while maintaining a large DC current through the source-drain channel. We find that the conductance of the sample in a strong parallel magnetic field is asymmetric with respect to the DC current direction. This asymmetry increases with magnetic field. The results are interpreted in terms of electron spin accumulation or depletion near the slot.
4 LaTeX pages, 2 figures. Annalen der Physik, in press
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