Epitaxial-strain effect on charge/orbital order in Pr0.5Ca0.5MnO3 films

Abstract

Effect of growth orientation on charge- and orbital-ordering (CO-OO) phenomena has been studied for Pr0.5Ca0.5MnO3 epitaxial thin films fabricated on (LaAlO3)0.3-(SrAl0.5Ta0.5O3)0.7 (LSAT) substrates by means of resistivity, synchrotron x-ray diffraction, and polarized optical microscopy measurements. CO-OO transition is observed around 220 K for a film grown on an LSAT (011) substrate ((011)-film), similarly to a bulk sample, while a film grown on a (001) plane of LSAT ((001)-film) shows much higher transition temperature around 300 K. The domain size of OO is approximately 3 times as large in the (011)-film as in the (001)-film. These results demonstrate that various properties of CO-OO phenomena can be controlled with the growth orientation via the epitaxial strain from the substrate.

arXiv comment4 pages, 4 figures

References in corpus (3)

• Hysteretic current-voltage characteristics and resistance switching at a rectifying Ti/Pr${}_{0.7}$Ca${}_{0.3}$MnO${}_3$ interface
• X-ray Resonant Scattering Studies of Orbital and Charge Ordering in Pr${}_{1-x}$Ca${}_x$MnO${}_3$
• Orbital Ordering Structures in (Nd,Pr)0.5Sr0.5MnO3 Manganite Thin Films on Perovskite (011) Substrates

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