14 citations
2 papers
cond-mat.mtrl-sci2025★ 8 cited
3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around (GAA) Transistors via Electron Ptychography
Shake Karapetyan, Steven E. Zeltmann, Glen Wilk +3
To improve transistor density and electronic performance, next-generation semiconductor devices are adopting three-dimensional architectures and feature sizes down to the few-nm re…
math.AG2008★ 14 cited
Some geometrical aspects of control points for toric patches
Gheorghe Craciun, Luis Garcia-Puente, Frank Sottile
We use ideas from algebraic geometry and dynamical systems to explain some ways that control points influence the shape of a Bézier curve or patch. In particular, we establish a ge…