352 citations · 860 across the 21 of their papers we have counts for
23 papers
Parallax Depth Sectioning and 3D Reconstruction in 4D-STEM
Desheng Ma, Chia-Hao Lee, Zixiao Shi +2
Three-dimensional (3D) information is encoded in four-dimensional scanning transmission electron microscopy (4D-STEM) through parallax between the virtual images formed at each det…
Three-Dimensional Imaging of High-Density Dislocation Networks and Their Interactions using Multislice Electron Ptychography
Eegene Chung, Anand Ithepalli, Naomi Pieczulewski +6
Development of novel devices often involve combining functional materials and substrates, each chosen for particular physical properties such as low-loss or thermal conductivity. T…
Using Aberrations to Improve Dose-Efficient Tilt-corrected 4D-STEM Imaging
Desheng Ma, David A Muller, Steven E Zeltmann
Tilt-corrected imaging methods in four-dimensional scanning transmission electron microscopy (4D-STEM) have recently emerged as a new class of direct ptychography methods that are…
3D Atomic-Scale Metrology of Strain Relaxation and Roughness in Gate-All-Around (GAA) Transistors via Electron Ptychography
Shake Karapetyan, Steven E. Zeltmann, Glen Wilk +3
To improve transistor density and electronic performance, next-generation semiconductor devices are adopting three-dimensional architectures and feature sizes down to the few-nm re…
Information in 4D-STEM: Where it is, and How to Use it
Desheng Ma, Guanxing Li, David A Muller +1
Contrast transfer mechanisms for electron scattering have been extensively studied in transmission electron microscopy. Here we revisit H. Rose's generalized contrast formalism fro…
PtyRAD: A High-performance and Flexible Ptychographic Reconstruction Framework with Automatic Differentiation
Chia-Hao Lee, Steven E. Zeltmann, Dasol Yoon +2
Electron ptychography has recently achieved unprecedented resolution, offering valuable insights across diverse material systems, including in three dimensions. However, high-quali…
Emittance Minimization for Aberration Correction II: Physics-informed Bayesian Optimization of an Electron Microscope
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang +6
Aberration-corrected Scanning Transmission Electron Microscopy (STEM) has become an essential tool in understanding materials at the atomic scale. However, tuning the aberration co…
Emittance Minimization for Aberration Correction I: Aberration correction of an electron microscope without knowing the aberration coefficients
Desheng Ma, Steven E. Zeltmann, Chenyu Zhang +6
Precise alignment of the electron beam is critical for successful application of scanning transmission electron microscopes (STEM) to understanding materials at atomic level. Despi…
Imaging interstitial atoms with multislice electron ptychography
Zhen Chen, Yu-Tsun Shao, Steven E. Zeltmann +5
Doping impurity atoms is a strategy commonly used to tune the functionality of materials including catalysts, semiconductors, and quantum emitters. The location of dopants and thei…
Random Forest Prediction of Crystal Structure from Electron Diffraction Patterns Incorporating Multiple Scattering
Samuel P. Gleason, Alexander Rakowski, Stephanie M. Ribet +5
Diffraction is the most common method to solve for unknown or partially known crystal structures. However, it remains a challenge to determine the crystal structure of a new materi…
A method for crystallographic mapping of an alpha-beta titanium alloy with nanometre resolution using scanning precession electron diffraction and open-source software libraries
Ian MacLaren, Enrique Frutos-Myro, Steven Zeltmann +1
An approach for the crystallographic mapping of two-phase alloys on the nanoscale using a combination of scanned precession electron diffraction and open-source python libraries is…
Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy
Georgios Varnavides, Stephanie M. Ribet, Steven E. Zeltmann +7
Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annula…
The 4D Camera: an 87 kHz direct electron detector for scanning/transmission electron microscopy
Peter Ercius, Ian J. Johnson, Philipp Pelz +19
We describe the development, operation, and application of the 4D Camera -- a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 8…
Design of Electrostatic Aberration Correctors for Scanning Transmission Electron Microscopy
Stephanie M. Ribet, Steven E. Zeltmann, Karen C. Bustillo +6
In a scanning transmission electron microscope (STEM), producing a high-resolution image generally requires an electron beam focused to the smallest point possible. However, the ma…
Crystal Toolkit: A Web App Framework to Improve Usability and Accessibility of Materials Science Research Algorithms
Matthew Horton, Jimmy-Xuan Shen, Jordan Burns +21
Crystal Toolkit is an open source tool for viewing, analyzing and transforming crystal structures, molecules and other common forms of materials science data in an interactive way.…
Uncovering polar vortex structures by inversion of multiple scattering with a stacked Bloch wave model
Steven E Zeltmann, Shang-Lin Hsu, Hamish G Brown +4
Nanobeam electron diffraction can probe local structural properties of complex crystalline materials including phase, orientation, tilt, strain, and polarization. Ideally, each dif…
One Dimensional Wormhole Corrosion in Metals
Yang Yang, Weiyue Zhou, Sheng Yin +16
Corrosion is a ubiquitous failure mode of materials in extreme environments. The more localized it is, the more difficult it is to detect and more deleterious its effects. Often, t…
Disentangling multiple scattering with deep learning: application to strain mapping from electron diffraction patterns
Joydeep Munshi, Alexander Rakowski, Benjamin H Savitzky +7
Implementation of a fast, robust, and fully-automated pipeline for crystal structure determination and underlying strain mapping for crystalline materials is important for many tec…
Automated Crystal Orientation Mapping in py4DSTEM using Sparse Correlation Matching
Colin Ophus, Steven E Zeltmann, Alexandra Bruefach +4
Crystalline materials used in technological applications are often complex assemblies composed of multiple phases and differently oriented grains. Robust identification of the phas…
Multibeam Electron Diffraction
Xuhao Hong, Steven E Zeltmann, Benjamin H Savitzky +5
One of the primary uses for transmission electron microscopy (TEM) is to measure diffraction pattern images in order to determine a crystal structure and orientation. In nanobeam e…
py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann +18
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-spee…
Observation of spin-momentum locked surface states in amorphous BiSe
Paul Corbae, Samuel Ciocys, Daniel Varjas +12
Crystalline symmetries have played a central role in the identification of topological materials. The use of symmetry indicators and band representations have enabled a classificat…
Patterned Probes for High Precision 4D-STEM Bragg Measurements
Steven E Zeltmann, Alexander Müller, Karen C Bustillo +4
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a seque…