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19942026
most citedMott transition in VO2 revealed by infrared spectroscopy and nano-imaging

1.5k citations

Showing 2016Show all

11 papers · 1 filter

cs.NI2016★ 6 cited

Performance analysis of smart digital signage system based on software-defined IoT and invisible image sensor communication

Mohammad Arif Hossain, Amirul Islam, Nam Tuan Le +3

Everything in the world is being connected, and things are becoming interactive. The future of the interactive world depends on the future Internet of Things (IoT). Software-define…

cond-mat.mes-hall2016★ 75 cited

SU-8 clamped CVD graphene drum resonators

Sunwoo Lee, Changyao Chen, Vikram V. Deshpande +8

Graphene mechanical resonators are the ultimate two-dimensional nanoelectromechanical systems (NEMS) with applications in sensing and signal processing. While initial devices have…

cs.NI2016★ 1 cited

Performance Analysis of License Assisted Access LTE with Asymmetric Hidden Terminals

H. R. Lee, H. Kim, H. J. Yang +2

License Assisted Access (LAA) LTE (LTE-LAA) is a new type of LTE that aggregates the licensed LTE bands with the unlicensed bands via carrier aggregation. To operate in unlicensed…

cond-mat.str-el2016★ 20 cited

Highly repeatable nanoscale phase coexistence in vanadium dioxide films

T. J. Huffman, D. J. Lahneman, S. L. Wang +4

The metal-insulator transition (MIT) in vanadium dioxide (VO2) has the potential to lead to a number of disruptive technologies, including ultra-fast data storage, optical switches…

cond-mat.str-el2016★ 36 cited

Direct observation of the M2 phase with its Mott transition in a VO film

Hoon Kim, Tetiana V. Slusar, Dirk Wulferding +7

In VO, the explicit origin of the insulator-to-metal transition is still disputable between Peierls and Mott insulators. Along with the controversy, its second monoclinic (M2)…

cond-mat.mtrl-sci2016

Optical Characterization of PtSi/Si by Spectroscopic Ellipsometry

Van Long Le, Tae Jung Kim, Han Gyeol Park +9

We report optical characterization of PtSi films for thermoelectric device applications by nondestructive spectroscopic ellipsometry (SE). Pt monolayer and Pt-Si multilayer which c…