output
19992023
most citedIn-plane uniaxial anisotropy rotations in (Ga,Mn)As thin films

204 citations

29 papers

physics.atom-ph2023★ 9 cited

Energy deposition and formation of nanostructures in the interaction of highly charged xenon ions with gold nanolayers

I. Stabrawa, D. Banaś, A. Kubala-Kukuś +10

The effect of the deposition of kinetic energy and neutralization energy of slow highly charged xenon ions on the process of the nanostructures creation at the surface of gold nano…

physics.app-ph2019★ 13 cited

Time resolution and dynamic range of field effect transistor based terahertz detectors

Przemyslaw Zagrajek, Sergey N. Danilov, Jacek Marczewski +8

We studied time resolution and response power dependence of three terahertz detectors based on significantly different types of field effect transistors. We analyzed the photorespo…

cond-mat.mtrl-sci2018★ 23 cited

Diffusion of Mn in gallium nitride: Experiment and modelling

Rafal Jakiela, Katarzyna Gas, Maciej Sawicki +1

The control over the structural homogeneity is of paramount importance for ternary nitride compounds - the second most important semiconducting material-class after Si, due to its…

cond-mat.stat-mech2016

Modeling of gas sample behavior in gas chromatography column

Zenon Gniazdowski, Pawel Kowalski

The equilibrium-dispersive model of the linear GC (gas chromatography) was derived using both assumptions and the method of its derivation different from the known in literature. I…

cond-mat.mtrl-sci2016★ 42 cited

Stretching magnetism with an electric field in a nitride semiconductor

D. Sztenkiel, M. Foltyn, G. P. Mazur +11

By direct magnetization measurements, performed employing a new detection scheme, we demonstrate an electrical control of magnetization in wurtzite (Ga,Mn)N. In this dilute magneti…

cond-mat.mes-hall2016★ 1 cited

New approach to exact extraction of piezoresistance coefficient

Zenon Gniazdowski, Bogdan Latecki, Pawel Kowalski

The extension of piezoresistance coefficient extraction method was proposed, for protection from errors in estimation of the thickness of the test structure membrane. This new appr…