54 citations
Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.
- Politecnico di TorinoIT7 papers
- Tallinn University of TechnologyEE3 papers
- Centre National de la Recherche ScientifiqueFR2 papers
- Commissariat à l'Énergie Atomique et aux Énergies AlternativesFR2 papers
- Laboratoire Interactions, Dynamiques et LasersFR2 papers
- Université Paris-SaclayFR2 papers
- CEA Paris-SaclayFR1 paper
- CEA Paris-Saclay - Etablissement de SaclayFR1 paper
- Institut d’Optique Graduate SchoolFR1 paper
- Institut National de Physique Nucléaire et de Physique des ParticulesFR1 paper
- IRIS Instruments (France)FR1 paper
- Laboratoire Charles FabryFR1 paper
10 papers
Composing Graph Theory and Deep Neural Networks to Evaluate SEU Type Soft Error Effects
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
Rapidly shrinking technology node and voltage scaling increase the susceptibility of Soft Errors in digital circuits. Soft Errors are radiation-induced effects while the radiation…
The Validation of Graph Model-Based, Gate Level Low-Dimensional Feature Data for Machine Learning Applications
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
As an alternative to traditional fault injection-based methodologies and to explore the applicability of modern machine learning algorithms in the field of reliability engineering,…
Modeling Gate-Level Abstraction Hierarchy Using Graph Convolutional Neural Networks to Predict Functional De-Rating Factors
Aneesh Balakrishnan, Thomas Lange, Maximilien Glorieux +2
The paper is proposing a methodology for modeling a gate-level netlist using a Graph Convolutional Network (GCN). The model predicts the overall functional de-rating factors of seq…
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
Selective mitigation or selective hardening is an effective technique to obtain a good trade-off between the improvements in the overall reliability of a circuit and the hardware o…
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
De-Rating or Vulnerability Factors are a major feature of failure analysis efforts mandated by today's Functional Safety requirements. Determining the Functional De-Rating of seque…
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
The Functional Failure Rate analysis of today's complex circuits is a difficult task and requires a significant investment in terms of human efforts, processing resources and tool…
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu +1
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can…
CEP-stable high-energy ytterbium doped fiber amplifier
Michele Natile, Loic Lavenu, Florent Guichard +8
We report on the CEP stabilization of an Yb-doped fiber amplifier system delivering 30 microjoules, 100 fs pulses at 100 kHz repetition rate. A single shot, every shot, measurement…
Spatio-temporal structure of a Petawatt femtosecond laser beam
Antoine Jeandet, Antonin Borot, Kei Nakamura +6
The development of optical metrology suited to ultrafast lasers has played a key role in the progress of these light sources in the last few decades. Measurement techniques providi…
Improved diffusing wave spectroscopy based on the automatized determination of the optical transport and absorption mean free path
Chi Zhang, Mathias Reufer, Danila Gaudino +1
Diffusing wave spectroscopy (DWS) can be employed as an optical rheology tool with numerous applications for studying the structure, dynamics and linear viscoelastic properties of…