15 citations · 44 across the 6 of their papers we have counts for
6 papers
Machine Learning Clustering Techniques for Selective Mitigation of Critical Design Features
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
Selective mitigation or selective hardening is an effective technique to obtain a good trade-off between the improvements in the overall reliability of a circuit and the hardware o…
On the Estimation of Complex Circuits Functional Failure Rate by Machine Learning Techniques
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
De-Rating or Vulnerability Factors are a major feature of failure analysis efforts mandated by today's Functional Safety requirements. Determining the Functional De-Rating of seque…
Machine Learning to Tackle the Challenges of Transient and Soft Errors in Complex Circuits
Thomas Lange, Aneesh Balakrishnan, Maximilien Glorieux +2
The Functional Failure Rate analysis of today's complex circuits is a difficult task and requires a significant investment in terms of human efforts, processing resources and tool…
Functional Failure Rate Due to Single-Event Transients in Clock Distribution Networks
Thomas Lange, Maximilien Glorieux, Dan Alexandrescu +1
With technology scaling, lower supply voltages, and higher operating frequencies clock distribution networks become more and more vulnerable to transients faults. These faults can…
RESCUE: Interdependent Challenges of Reliability, Security and Quality in Nanoelectronic Systems
Maksim Jenihhin, Said Hamdioui, Matteo Sonza Reorda +15
The recent trends for nanoelectronic computing systems include machine-to-machine communication in the era of Internet-of-Things (IoT) and autonomous systems, complex safety-critic…
On the Optimal Design of Triple Modular Redundancy Logic for SRAM-based FPGAs
F. Lima Kastensmidt, L. Sterpone, L. Carro +1
Triple Modular Redundancy (TMR) is a suitable fault tolerant technique for SRAM-based FPGA. However, one of the main challenges in achieving 100% robustness in designs protected by…