most citedOFF-state trapping phenomena in GaN HEMTs: interplay between gate trapping, acceptor ionization and positive charge redistribution

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cs.CE2016★ 5 cited

Electrothermal Simulation of Bonding Wire Degradation under Uncertain Geometries

Thorben Casper, Herbert De Gersem, Renaud Gillon +4

In this paper, electrothermal field phenomena in electronic components are considered. This coupling is tackled by multiphysical field simulations using the Finite Integration Tech…