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9 papers · 1 filter
How Fast is Your Detector? The Effect of Temporal Response on Image Quality
Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…
Correcting for probe wandering by precession path segmentation
Gregory Nordahl, Lewys Jones, Emil Frang Christiansen +2
Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the b…
A computational method to estimate spin-orbital interaction strength in solid state systems
Qiangqiang Gu, Shishir Kumar Pandey
Spin-orbit coupling (SOC) drives interesting and non-trivial phenomena in solid state physics, ranging from topological to magnetic to transport properties. Thorough study of such…
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…
Strain-induced stacking transition in bilayer graphene
Nina C. Georgoulea, Stephen R. Power, Nuala M. Caffrey
Strain, both naturally occurring and deliberately engineered, can have a considerable effect on the structural and electronic properties of 2D and layered materials. Uniaxial or bi…
Atomic-scale Oxygen-mediated Etching of 2D MoS and MoTe
E. Harriet Åhlgren, Alexander Markevich, Sophie Scharinger +6
Some of the materials are more affected by oxidation than others. To elucidate the oxidation-induced degradation mechanisms in transition metal chalcogenides, the chemical effects…