1.1k citations
Counting papers with at most 25 authors, so collaboration author lists do not stand in for the people here.
- Trinity College DublinIE109 papers
- Universität der Bundeswehr MünchenDE8 papers
- University College CorkIE8 papers
- Fudan UniversityCN7 papers
- University of ViennaAT7 papers
- Chinese Academy of SciencesCN6 papers
- State Key Laboratory of Surface Physics6 papers
- Tyndall National InstituteIE6 papers
- Collaborative Innovation Center of Advanced MicrostructuresCN5 papers
- Dublin City UniversityIE4 papers
- Helmholtz-Zentrum Dresden-RossendorfDE4 papers
- University of CambridgeGB4 papers
6 papers · 1 filter
Single-pulse all-optical switching in amorphous DyCo and TbCo
Zexiang Hu, Jean Besbas, Ross Smith +5
Repeated uniform switching of the magnetization of thin films of ferrimagnetic amorphous Gd(FeCo) in response to single fast laser pulses is well established. Here we…
DFT+U+J with linear response parameters predicts non-magnetic oxide band gaps with hybrid-functional accuracy
Daniel S. Lambert, David D. O'Regan
First-principles Hubbard-corrected approximate density-functional theory (DFT+U) is a low-cost, potentially high throughput method of simulating materials, but it has been hampered…
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan +2
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher v…
Decoding the DC and optical conductivities of disordered MoS films: an inverse problem
F. R. Duarte, S. Mukim, A. Molina-Sánchez +2
To calculate the conductivity of a material having full knowledge of its composition is a reasonably simple task. To do the same in reverse, i.e., to find information about the com…
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
Colum M. O'Leary, Benedikt Haas, Christoph T. Koch +2
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementin…