activity
20162023
most citedInterface-induced Polarization in SrTiO-LaCrO Superlattices

30 citations · 135 across the 16 of their papers we have counts for

collaborators

16 papers

cond-mat.mes-hall2023

3D-imaging of Printed Nanostructured Networks using High-resolution FIB-SEM Nanotomography

Cian Gabbett, Luke Doolan, Kevin Synnatschke +10

Networks of solution-processed nanomaterials are important for multiple applications in electronics, sensing and energy storage/generation. While it is known that network morpholog…

physics.ins-det2022★ 9 cited

How Fast is Your Detector? The Effect of Temporal Response on Image Quality

Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3

With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…

physics.ins-det2022

An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy

Patrick McBean, Zachary Milne, Arjun Kanthawar +3

The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used ac…

physics.ins-det2022

A Retrofittable Photoelectron Gun Proposal for Improved Low Voltage Imaging

Frances Quigley, Clive Downing, Cormac McGuinness +1

Low voltage scanning electron microscopy is a powerful tool for examining surface features and imaging beam sensitive materials. Improving resolution during low voltage imaging is…

physics.ins-det2022★ 6 cited

Correcting for probe wandering by precession path segmentation

Gregory Nordahl, Lewys Jones, Emil Frang Christiansen +2

Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the b…

physics.ins-det2022★ 10 cited

Interlacing in atomic resolution scanning transmission electron microscopy

Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2

Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…