30 citations · 135 across the 16 of their papers we have counts for
5 papers · 1 filter
How Fast is Your Detector? The Effect of Temporal Response on Image Quality
Tiarnan Mullarkey, Matthew Geever, Jonathan J. P. Peters +3
With increasing interest in high-speed imaging should come an increased interest in the response times of our scanning transmission electron microscope (STEM) detectors. Previous w…
An Accessible Method for Simulating Charged-Particle Optics, with Examples for Transmission Electron Microscopy
Patrick McBean, Zachary Milne, Arjun Kanthawar +3
The transmission electron microscope (TEM) has become an essential tool for innovation in nanoscience, material science, and biology. Despite these instruments being widely used ac…
A Retrofittable Photoelectron Gun Proposal for Improved Low Voltage Imaging
Frances Quigley, Clive Downing, Cormac McGuinness +1
Low voltage scanning electron microscopy is a powerful tool for examining surface features and imaging beam sensitive materials. Improving resolution during low voltage imaging is…
Correcting for probe wandering by precession path segmentation
Gregory Nordahl, Lewys Jones, Emil Frang Christiansen +2
Precession electron diffraction has in the past few decades become a powerful technique for structure solving, strain analysis, and orientation mapping, to name a few. One of the b…
Interlacing in atomic resolution scanning transmission electron microscopy
Jonathan J. P Peters, Tiarnan Mullarkey, James A. Gott +2
Fast frame-rates are desirable in scanning transmission electron microscopy for a number of reasons: controlling electron beam dose, capturing in-situ events or reducing the appear…