30 citations · 135 across the 16 of their papers we have counts for
5 papers · 1 filter
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan +2
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher v…
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
Procedure for 3D atomic resolution reconstructions using atom-counting and a Bayesian genetic algorithm
Annick De Backer, Sandra Van Aert, Peter D. Nellist +1
We introduce a Bayesian genetic algorithm for reconstructing atomic models of nanoparticles from a single projection using Z-contrast imaging. The number of atoms in a projected at…
Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
Colum M. O'Leary, Benedikt Haas, Christoph T. Koch +2
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementin…
Unlocking the Origin of Compositional Fluctuations in InGaN Light Emitting Diodes
Tara P. Mishra, Govindo J. Syaranamual, Zeyu Deng +8
The accurate determination of the compositional fluctuations is pivotal in understanding their role in the reduction of efficiency in high indium content light-em…