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Showing 2021 · physics.ins-detShow all
3 papers · 2 filters
physics.ins-det2021★ 4 cited
Cost & Capability Compromises in STEM Instrumentation for Low-Voltage Imaging
Frances Quigley, Patrick McBean, Peter O'Donovan +2
Low voltage transmission electron microscopy (<=80 kV) has many applications in imaging beam-sensitive samples, such as metallic nanoparticles, which may become damaged at higher v…
physics.ins-det2021★ 19 cited
Using Your Beam Efficiently: Reducing Electron-dose in the STEM via Flyback Compensation
Tiarnan Mullarkey, Jonathan J. P. Peters, Clive Downing +1
In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal-noi…
physics.ins-det2021★ 2 cited
Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
Colum M. O'Leary, Benedikt Haas, Christoph T. Koch +2
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope (STEM) using a pixelated detector, is complementin…