most citedSilicene Like Domains on IrSi3 Crystallites

7 citations · 12 across the 4 of their papers we have counts for

collaborators
Showing physics.chem-phShow all

1 paper · 1 filter

physics.chem-ph2024★ 4 cited

A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy

Carlos Munoz, Thomas Iken, Nuri Oncel

X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak…