7 citations · 12 across the 4 of their papers we have counts for
4 papers
A systematic study to investigate the effects of X-ray exposure on electrical properties of silicon dioxide thin films using X-ray photoelectron spectroscopy
Carlos Munoz, Thomas Iken, Nuri Oncel
X-ray Photoelectron Spectroscopy (XPS) is generally used for chemical analysis of surfaces and interfaces. This method involves the analysis of changes in binding energies and peak…
Probing Electrical Properties of A Silicon Nanocrystal Thin Film Using X-ray Photoelectron Spectroscopy
Amrit Laudari, Sameera Pathiranage, Salim A. Thomas +5
We performed X-ray photoelectron spectroscopy (XPS) measurements on a thin film of Si nanocrystals (SiNCs) while applying DC or AC external biases to extract the resistance and the…
Silicene Like Domains on IrSi3 Crystallites
Dylan Nicholls, Fatima, Deniz Çakır +1
Recently, silicene, the graphene equivalent of silicon, has attracted a lot of attention due to its compatibility with Si-based electronics. So far, silicene has been epitaxy grown…
A Multidisciplinary Undergraduate Nanoscience and Nanotechnology Program at the University of North Dakota
Naima Kaabouch, Deborah Worley, Matt Cavalli +5
This paper describes some of the results of a National Science Foundation Nanotechnology Undergraduate Education project that aims to establish a nanoscience and nanotechnology pro…