90 citations · 307 across the 5 of their papers we have counts for
5 papers
Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage, John D. Barry +1
We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency…
Broadband dielectric microwave microscopy on m length scales
Alexander Tselev, Steven M. Anlage, Zhengkun Ma +1
We demonstrate that a near-field microwave microscope based on a transmission line resonator allows imaging in a substantially wide range of frequencies, so that the microscope pro…
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…
Quantitative imaging of dielectric permittivity and tunability with a near-field scanning microwave microscope
D. E. Steinhauer, C. P. Vlahacos, F. C. Wellstood +5
We describe the use of a near-field scanning microwave microscope to image the permittivity and tunability of bulk and thin film dielectric samples on a length scale of about 1 mic…
Imaging of Microwave Permittivity, Tunability, and Damage Recovery in (Ba,Sr)TiO3 Thin Films
D. E. Steinhauer, C. P. Vlahacos, C. Canedy +5
We describe the use of a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectric samples on a length sca…