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cond-mat.mtrl-sci2004★ 28 cited
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…
cond-mat.mtrl-sci2002
A novel Microwave Frequency Scanning Capacitance Microscope
Atif Imtiaz, Steven M. Anlage
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm ab…