63 citations · 151 across the 4 of their papers we have counts for
4 papers
Nanometer-Scale Materials Contrast Imaging with a Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage, John D. Barry +1
We report topography-free materials contrast imaging on a nano-fabricated Boron-doped Silicon sample measured with a Near-field Scanning Microwave Microscope over a broad frequency…
Effect of tip-geometry on contrast and spatial-resolution of the Near-Field Microwave Microscope
Atif Imtiaz, Steven M. Anlage
The Near-Field Scanning Microwave Microscope (NSMM) can quantitatively image materials properties at length scales far shorter than the free space wavelength (λ). Here we report a…
Near-Field Microwave Microscopy on nanometer length scales
Atif Imtiaz, Marc Pollak, Steven M Anlage +2
The Near-Field Microwave Microscope (NSMM) can be used to measure ohmic losses of metallic thin films. We report on the presence of a new length scale in the probe-to- sample inter…
A novel Microwave Frequency Scanning Capacitance Microscope
Atif Imtiaz, Steven M. Anlage
We report a new technique of scanning capacitance microscopy at microwave frequencies. A near field scanning microwave microscope probe is kept at a constant height of about 1nm ab…