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Finite geometry models of electric field noise from patch potentials in ion traps
Guang Hao Low, Peter F. Herskind, Isaac L. Chuang
We model electric field noise from fluctuating patch potentials on conducting surfaces by taking into account the finite geometry of the ion trap electrodes to gain insight into th…
Laser-induced charging of microfabricated ion traps
Shannon X. Wang, Guang Hao Low, Nathan S. Lachenmyer +3
Electrical charging of metal surfaces due to photoelectric generation of carriers is of concern in trapped ion quantum computation systems, due to the high sensitivity of the ions'…
Surface-electrode ion trap with integrated light source
Tony Hyun Kim, Peter F. Herskind, Isaac L. Chuang
An atomic ion is trapped at the tip of a single-mode optical fiber in a cryogenic (8 K) surface-electrode ion trap. The fiber serves as an integrated source of laser light, which d…