activity
20172022
most citedPhase Change Logic via Thermal Cross-Talk for Computation in Memory

3 citations · 8 across the 8 of their papers we have counts for

collaborators

11 papers

physics.app-ph20223 cited

Stopping Resistance Drift in Phase Change Memory Cells and Analysis of Charge Transport in Stable Amorphous Ge2Sb2Te5

Md Tashfiq Bin Kashem, Raihan Sayeed Khan, ABM Hasan Talukder +2

We stabilize resistance of melt-quenched amorphous Ge2Sb2Te5 (a-GST) phase change memory (PCM) line cells by substantially accelerating resistance drift and bringing it to a stop w…

physics.app-ph2021

Temperature Dependent Characteristics and Electrostatic Threshold Voltage Tuning of Accumulated Body MOSFETs

A. B. M. Hasan Talukder, Brittany Smith, Mustafa Akbulut +3

Narrow-channel accumulated body nMOSFET devices with p-type side-gates surrounding the active area have been electrically characterized between 100 and 400 K with varied side-gate…

cond-mat.mtrl-sci20213 cited

Phase Change Logic via Thermal Cross-Talk for Computation in Memory

Nadim Kanan, Raihan Sayeed Khan, Zachary Woods +2

We have computationally demonstrated logic function implementations using lateral and vertical multi-contact phase change devices integrated with CMOS circuitry, which use thermal…

cs.ET20201 cited

Scaling of Multi-contact Phase Change Device for Toggle Logic Operations

Raihan Sayeed Khan, Nadim H. Kanan, Jake Scoggin +2

Scaling of two dimensional six-contact phase change devices that can perform toggle logic operations is analyzed through 2D electrothermal simulations with dynamic materials modeli…

physics.app-ph2020

Accelerating and Stopping Resistance Drift in Phase Change Memory Cells via High Electric Field Stress

Raihan Sayeed Khan, A. Hasan Talukder, Faruk Dirisaglik +2

We observed resistance drift in 125 K - 300 K temperature range in melt quenched amorphous Ge2Sb2Te5 line-cells with length x width x thickness = ~500 nm x ~100 nm x ~ 50 nm. Drift…

physics.app-ph2020

Resistance Drift in Ge2Sb2Te5 Phase Change Memory Line Cells at Low Temperatures and Its Response to Photoexcitation

Raihan Sayeed Khan, Faruk Dirisaglik, Ali Gokirmak +1

Resistance drift in phase change materials is characterized in amorphous phase change memory line-cells from 300 K to 125 K range and is observed to follow the previously reported…