activity
20152021
most citedLocal Temperature Redistribution and Structural Transition During Joule-Heating-Driven Conductance Switching in VO2

238 citations · 1.2k across the 18 of their papers we have counts for

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Showing cond-mat.mtrl-sciShow all

12 papers · 1 filter

cond-mat.mtrl-sci2021★ 1 cited

Improved Hopfield Network Optimization using Manufacturable Three-terminal Electronic Synapses

Su-in Yi, Suhas Kumar, R. Stanley Williams

We describe via simulation novel optimization algorithms for a Hopfield neural network constructed using manufacturable three-terminal Silicon-Oxide-Nitride-Oxide-Silicon (SONOS) s…

cond-mat.mtrl-sci2021★ 132 cited

Universal phase dynamics in VO2 switches revealed by ultrafast operando diffraction

Aditya Sood, Xiaozhe Shen, Yin Shi +9

Strongly correlated materials that exhibit an insulator-metal transition are key candidates in the search for new computing platforms. Understanding the pathways and timescales und…

cond-mat.mtrl-sci2020★ 1 cited

Size scaling, dynamics, and electro-thermal bifurcation of VO2 Mott oscillators

Stephanie M. Bohaichuk, Suhas Kumar, Miguel Muñoz Rojo +7

Traditional electronic devices are well-known to improve in speed and energy-efficiency as their dimensions are reduced to the nanoscale. However, this scaling behavior remains unc…

cond-mat.mtrl-sci2017★ 81 cited

Oxygen migration during resistance switching and failure of hafnium oxide memristors

Suhas Kumar, Ziwen Wang, Xiaopeng Huang +7

While the recent establishment of the role of thermophoresis/diffusion-driven oxygen migration during resistance switching in metal oxide memristors provided critical insights requ…

cond-mat.mtrl-sci2017★ 34 cited

Spatially uniform resistance switching of low current, high endurance titanium-niobium-oxide memristors

Suhas Kumar, Noraica Davila, Ziwen Wang +6

We analyzed micrometer-scale titanium-niobium-oxide prototype memristors, which exhibited low write-power (<3 μW) and energy (<200 fJ/bit/μm2), low read-power (~nW), and high endur…

cond-mat.mtrl-sci2017★ 127 cited

Conduction Channel Formation and Dissolution Due to Oxygen Thermophoresis/Diffusion in Hafnium Oxide Memristors

Suhas Kumar, Ziwen Wang, Xiaopeng Huang +7

Transition metal oxide memristors, or resistive random-access memory (RRAM) switches, are under intense development for storage-class memory because of their favorable operating po…