172 citations · 640 across the 16 of their papers we have counts for
Showing 2016 · cond-mat.mes-hallShow all
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cond-mat.mes-hall2016★ 33 cited
Quantum state readout of individual quantum dots by electrostatic force detection
Yoichi Miyahara, Antoine Roy-Gobeil, Peter Grutter
Electric charge detection by atomic force microscopy (AFM) with single- electron resolution (e-EFM) is a promising way to investigate the electronic level structure of individual q…
cond-mat.mes-hall2016★ 55 cited
The lower limit for time resolution in frequency modulation atomic force microscopy
Zeno Schumacher, Andreas Spielhofer, Yoichi Miyahara +1
Atomic force microscopy (AFM) routinely achieves structural information in the sub-nm length scale. Measuring time resolved properties on this length scale to understand kinetics a…