collaborators

7 papers

physics.ins-det2026

Review of prototypes developed in a 65 nm CMOS imaging technology in view of vertexing applications at a future lepton collider

Finn King, Matthew Lewis Franks, Yajun He +21

The OCTOPUS project addresses the development and characterization of monolithic active pixel sensors in the TPSCo 65 nm ISC technology in view of vertexing applications at a futur…

physics.ins-det2026

Advancements and future expansions of the Caribou DAQ system

Younes Otarid, Mathieu Benoit, Eric Buschmann +9

Caribou is a versatile data acquisition (DAQ) system developed within several collaborative frameworks (CERN EP R&D, DRD3, AIDAinnova, and Tangerine) to support laboratory and test…

physics.ins-det2025

Further Characterisation of Digital Pixel Test Structures Implemented in a 65 nm CMOS Process

Gianluca Aglieri Rinella, Nicole Apadula, Anton Andronic +55

The next generation of MAPS for future tracking detectors will have to meet stringent requirements placed on them. One such detector is the ALICE ITS3 that aims to be very light at…

physics.ins-det2025

The H2M Monolithic Active Pixel Sensor -- characterizing non-uniform in-pixel response in a 65 nm CMOS imaging technology

Sara Ruiz Daza, Rafael Ballabriga, Eric Buschmann +28

The high energy physics community recently gained access to the TPSCo 65 nm ISC (Image Sensor CMOS), which enables a higher in-pixel logic density in monolithic active pixel sensor…

physics.ins-det2025

Impact of the circuit layout on the charge collection in a monolithic pixel sensor

Corentin Lemoine, Rafael Ballabriga, Eric Buschmann +28

CERN's strategic R&D programme on technologies for future experiments recently started investigating the TPSCo 65nm ISC CMOS imaging process for monolithic active pixels sensors fo…

physics.ins-det2025

Transient studies using a TCAD and Allpix Squared combination approach

Manuel A. Del Rio Viera, Eric Buschmann, Ankur Chauhan +22

The goal of the TANGERINE project is to develop the next generation of monolithic silicon pixel detectors using a 65 nm CMOS imaging process, which offers a higher logic density an…