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N. Srivastava

10 papers hereh-index 10641 citations21 works total

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • first author3
  • middle author5

Across the 8 of 10 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci6
  • cond-mat.mes-hall4
same name
  • N. Srivastava — 33 papers, h 21
  • N. Srivastava — 26 papers, h 23
  • N. Srivastava — 13 papers, h 4
  • N. Srivastava — 2 papers, h 16
  • N. Srivastava — 2 papers, h 5
  • N. Srivastava — 1 paper, h 8

Either other researchers who publish under this name, or the same person where the external sources have not merged their records.

identity via Semantic Scholar / OpenAlex

activity
20092014
most citedLow-energy Electron Reflectivity from Graphene

106 citations · 423 across the 10 of their papers we have counts for

collaborators
Showing 2010Show all

3 papers · 1 filter

cond-mat.mtrl-sci2010★ 106 cited

Comparison of Graphene Formation on C-face and Si-face SiC {0001} Surfaces

Luxmi, N. Srivastava, Guowei He +1

The morphology of graphene formed on the (000-1) surface (the C-face) and the (0001) surface (the Si-face) of SiC, by annealing in ultra-high vacuum or in an argon environment, is…

cond-mat.mtrl-sci2010★ 29 cited

Formation of Epitaxial Graphene on SiC(0001) using Vacuum or Argon Environments

Luxmi, N. Srivastava, R. M. Feenstra +1

The formation of graphene on the (0001) surface of SiC (the Si-face) is studied by atomic force microscopy, low-energy electron microscopy, and scanning tunneling microscopy/spectr…

cond-mat.mtrl-sci2010

Thickness monitoring of graphene on SiC using low-energy electron diffraction

P. J. Fisher, Luxmi, N. Srivastava +2

The formation of epitaxial graphene on SiC is monitored in-situ using low-energy electron diffraction (LEED). The possibility of using LEED as an in-situ thickness monitor of the g…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.