activity
20082026
most citedHOLMES - The Electron Capture Decay of 163Ho to Measure the Electron Neutrino Mass with sub-eV sensitivity

146 citations · 879 across the 38 of their papers we have counts for

collaborators

38 papers

astro-ph.IM2026★ 26 cited

Broad-band High-Energy Resolution Hard X-ray Spectroscopy using Transition Edge Sensors at SPring-8

Shinya Yamada, Yuto Ichinohe, Hideyuki Tatsuno +40

We have succeeded in operating a transition-edge sensor (TES) spectrometer and evaluating its performance at the SPring-8 synchrotron X-ray light source. The TES spectrometer consi…

astro-ph.IM2023★ 10 cited

Improved microwave SQUID multiplexer readout using a kinetic-inductance traveling-wave parametric amplifier

M. Malnou, J. A. B. Mates, M. R. Vissers +5

We report on the use of a kinetic-inductance traveling-wave parametric amplifier (KITWPA) as the first amplifier in the readout chain of a microwave superconducting quantum interfe…

astro-ph.IM2023

ASCENT - A balloon-borne hard X-ray imaging spectroscopy telescope using transition edge sensor microcalorimeter detectors

Fabian Kislat, Daniel Becker, Douglas Bennett +26

Core collapse supernovae are thought to be one of the main sources in the galaxy of elements heavier than iron. Understanding the origin of the elements is thus tightly linked to o…

physics.ins-det2022★ 12 cited

A tabletop x-ray tomography instrument for nanometer-scale imaging: demonstration of the 1,000-element transition-edge sensor subarray

Paul Szypryt, Nathan Nakamura, Daniel T. Becker +28

We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines a high spatial reso…

physics.ins-det2022★ 18 cited

Design of a 3000-pixel transition-edge sensor x-ray spectrometer for microcircuit tomography

Paul Szypryt, Douglas A. Bennett, William J. Boone +28

Feature sizes in integrated circuits have decreased substantially over time, and it has become increasingly difficult to three-dimensionally image these complex circuits after fabr…

physics.ins-det2022★ 3 cited

Nanoscale Three-Dimensional Imaging of Integrated Circuits using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer

Nathan Nakamura, Paul Szypryt, Amber L. Dagel +30

X-ray nanotomography is a powerful tool for the characterization of nanoscale materials and structures, but is difficult to implement due to competing requirements on X-ray flux an…