244 citations · 811 across the 15 of their papers we have counts for
15 papers
Roadmap for focused ion beam technologies
Katja Höflich, Gerhard Hobler, Frances I. Allen +29
The focused ion beam (FIB) is a powerful tool for the fabrication, modification and characterization of materials down to the nanoscale. Starting with the gallium FIB, which was or…
Universal radiation tolerant semiconductor
Alexander Azarov, Javier García Fernández, Junlei Zhao +10
Radiation tolerance is determined as the ability of crystalline materials to withstand the accumulation of the radiation induced disorder. Nevertheless, for sufficiently high fluen…
Deterministic multi-level spin orbit torque switching using He+ microscopy patterning
Jinu Kurian, Aleena Joseph, Salia Cherifi-Hertel +7
He ion irradiation is used to pattern multiple areas of Pt/Co/W films with different irradiation doses in Hall bars. The resulting perpendicular magnetic anisotropy landscape e…
Tailoring crosstalk between localized 1D spin-wave nanochannels using focused ion beams
Vadym Iurchuk, Javier Pablo-Navarro, Tobias Hula +8
1D spin-wave conduits are envisioned as nanoscale components of magnonics-based logic and computing schemes for future generation electronics. `A-la-carte methods of versatile cont…
Wafer-scale nanofabrication of telecom single-photon emitters in silicon
M. Hollenbach, N. Klingner, N. S. Jagtap +9
A highly promising route to scale millions of qubits is to use quantum photonic integrated circuits (PICs), where deterministic photon sources, reconfigurable optical elements, and…
Helium Ion Microscopy for Reduced Spin Orbit Torque Switching Currents
Peter Dunne, Ciaran Fowley, Gregor Hlawacek +11
Spin orbit torque driven switching is a favourable way to manipulate nanoscale magnetic objects for both memory and wireless communication devices. The critical current required to…
An atomic force microscope integrated with a helium ion microscope for correlative nanocharacterization
Santiago H. Andany, Gregor Hlawacek, Stefan Hummel +3
In this work, we report the integration of an atomic force microscope (AFM) into a helium ion microscope (HIM). The HIM is a powerful instrument, capable of sub-nanometer resolutio…
Site-controlled formation of single Si nanocrystals in a buried SiO2 matrix using ion beam mixing
Xiaomo Xu, Thomas Prüfer, Daniel Wolf +8
For future nanoelectronic devices - such as room-temperature single electron transistors - the site-controlled formation of single Si nanocrystals (NCs) is a crucial prerequisite.…
Morphology modifcation of Si nanopillars under ion irradiation at elevated temperatures: plastic deformation and controlled thinning to 10 nm
Xiaomo Xu, Karl-Heinz Heinig, Wolfhard Möller +6
Si nanopillars of less than 50 nm diameter have been irradiated in a helium ion microscope with a focused Ne beam. The morphological changes due to ion beam irradiation at room…
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Gregor Hlawacek, Maciej Jankowski, Herbert Wormeester +3
Helium Ion Microscopy is known for its surface sensitivity and high lateral resolution. Here, we present results of a Helium Ion Microscopy based investigation of a surface confine…
Helium Ion Microscopy
Gregor Hlawacek, Vasilisa Veligura, Raoul van Gastel +1
Helium Ion Microcopy (HIM) based on Gas Field Ion Sources (GFIS) represents a new ultra high resolution microscopy and nano-fabrication technique. It is an enabling technology that…
To see or not to see: Imaging surfactant coated nano--particles using HIM and SEM
Gregor Hlawacek, Imtiaz Ahmad, Mark A. Smithers +1
Nano--particles are of great interest in fundamental and applied research. However, their accurate visualization is often difficult and the interpretation of the obtained images ca…
Nucleation and growth of thin films of rod--like conjugated molecules
Gregor Hlawacek, Christian Teichert
Thin films formed from small molecules rapidly gain importance in different technological fields. To explain their growth, methods developed for zero--dimensional atoms as the film…
The influence of substrate temperature on growth of para-sexiphenyl thin films on Ir{111} supported graphene studied by LEEM
Fawad S. Khokhar, Gregor Hlawacek, Raoul van Gastel +3
The growth of para-sexiphenyl (6P) thin films as a function of substrate temperature on Ir{111} supported graphene flakes has been studied in real-time with Low Energy Electron Mic…
Hierarchy of adhesion forces in patterns of photoreactive surface layers
G. Hlawacek, Q. Shen, C. Teichert +3
Precise control of surface properties including electrical characteristics, wettability, and friction is a prerequisite for manufacturing modern organic electronic devices. The suc…