12 citations · 12 across the 2 of their papers we have counts for
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cond-mat.mtrl-sci2012★ 12 cited
Measuring roughness of buried interfaces by sputter depth profiling
S. V. Baryshev, J. A. Klug, A. V. Zinovev +3
In this communication, we report results of a high resolution sputter depth profiling analysis of a stack of 16 alternating MgO and ZnO nanolayers grown by atomic layer deposition…
cond-mat.mtrl-sci2012
High resolution SIMS depth profiling of nanolayers
S. V. Baryshev, A. V. Zinovev, C. E. Tripa +4
We report results of high-resolution TOF SIMS (time of flight secondary ion mass spectrometry) depth profiling experiments on a nanolayered structure, a stack of 16 alternating MgO…