40 citations · 62 across the 6 of their papers we have counts for
3 papers · 1 filter
High-Throughput Atomic Force Microscopes Operating in Parallel
H. Sadeghian, R. Herfst, B. Dekker +3
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for stat…
Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy
Tom Bijnagte, Geerten Kramer, Lukas Kramer +3
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manual…
Meta-instrument: high speed positioning and tracking platform for near-field optical imaging microscopes
R. J. F. Bijster, R. W. Herfst, J. P. F. Spierdijk +6
High resolution and high throughput imaging are typically mutually exclusive. The meta-instrument pairs high resolution optical concepts such as nano-antennas, superoscillatory len…