40 citations · 62 across the 6 of their papers we have counts for
6 papers
Analysis of contact stiffness in Ultrasound Atomic Force Microscopy: Three-dimensional time-dependent ultrasound modeling
Daniele Piras, Hamed Sadeghian
Ultrasound Atomic Force Microscopy (US-AFM) has been used for subsurface imaging of nanostructures. The contact stiffness variations have been suggested as the origin of the image…
High-Throughput Atomic Force Microscopes Operating in Parallel
H. Sadeghian, R. Herfst, B. Dekker +3
Atomic force microscopy (AFM) is an essential nanoinstrument technique for several applications such as cell biology and nanoelectronics metrology and inspection. The need for stat…
Surface stress effects on the electrostatic pull-in instability of nanomechanical systems
Hamed Sadeghian
The electrostatic pull-in instability (EPI), within the framework of the nanoelectromechanical systems (NEMS) has been shown as a robust and versatile method for characterizing mec…
Automated cantilever exchange and optical alignment for High-throughput, parallel atomic force microscopy
Tom Bijnagte, Geerten Kramer, Lukas Kramer +3
In atomic force microscopy (AFM), the exchange and alignment of the AFM cantilever with respect to the optical beam and position-sensitive detector (PSD) are often performed manual…
Meta-instrument: high speed positioning and tracking platform for near-field optical imaging microscopes
R. J. F. Bijster, R. W. Herfst, J. P. F. Spierdijk +6
High resolution and high throughput imaging are typically mutually exclusive. The meta-instrument pairs high resolution optical concepts such as nano-antennas, superoscillatory len…
Towards thermal noise free optomechanics
Michael Page, Yiqiu Ma, Chunnong Zhao +6
Thermal noise generally greatly exceeds quantum noise in optomechanical devices unless the mechanical frequency is very high or the thermodynamic temperature is very low. This pape…