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researcher

Uwe Scheithauer

4 papers here

Matching runs newest-first, so older work may not be attached to this profile yet.

author position
  • sole author3
  • first author1

Across the 4 of 4 papers where every author was matched, so the position is known.

fields
  • cond-mat.mtrl-sci2
  • physics.ins-det2
ORCID 0000-0002-4776-0678

identity via Semantic Scholar / OpenAlex

activity
20132017
most citedA new LEED Instrument for Quantitative Spot Profile Analysis

300 citations · 311 across the 4 of their papers we have counts for

collaborators
Showing 2017Show all

1 paper · 1 filter

physics.ins-det2017★ 3 cited

Vacuum Quality Monitoring of Analytical Sputter Depth Profile Equipment by Recontamination Measurements of a Sputtered Ti Surface

Uwe Scheithauer

Often a surface sensitive analytical technique in combination with sample erosion by inert ion sputtering is used for compositional in-depth analysis of solid state samples. Layer…

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Not affiliated with arXiv. Researcher data from Semantic Scholar (ODC-BY) and OpenAlex.