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20052023
most citedOn the likelihood of multiple bit upsets in logic circuits

6 citations · 6 across the 12 of their papers we have counts for

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Showing 2017 · cs.ETShow all

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cs.ET2017

Neutron-induced strike: Study of multiple node charge collection in 14nm FinFETs

Nanditha P. Rao, Madhav P. Desai

FinFETs have replaced the conventional bulk CMOS transistors in the sub-20nm technology. One of the key issues to consider is, the vulnerability of FinFET based circuits to multipl…