activity
20052023
most citedOn the likelihood of multiple bit upsets in logic circuits

6 citations · 6 across the 12 of their papers we have counts for

collaborators
Showing cs.ETShow all

1 paper · 1 filter

cs.ET2017

Neutron-induced strike: Study of multiple node charge collection in 14nm FinFETs

Nanditha P. Rao, Madhav P. Desai

FinFETs have replaced the conventional bulk CMOS transistors in the sub-20nm technology. One of the key issues to consider is, the vulnerability of FinFET based circuits to multipl…