13 papers
Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing
J. S. van Hulst, A. M. C. de Peffer, D. Herceg +4
Electron microscopy requires nanometer-scale specimen positioning over a long stroke. Piezo-stepper actuators are well suited for this task, but their accuracy is limited by hyster…
Constructing VAE Latent Spaces with Prescribed Topology
Jilles S. van Hulst, Jakub M. Tomczak, W. P. M. H. Heemels +1
Variational autoencoders (VAEs) learn low-dimensional latent representations of high-dimensional data. When the data lies on a manifold with non-Euclidean topology, the standard Ga…
Estimating Evolving Functions with Dynamic Gaussian Processes
J. S. van Hulst, W. P. M. H. Heemels, D. J. Antunes
This paper develops the Dynamic Gaussian Process (DGP), a framework for estimating functions governed by integro-difference equations (IDEs). IDEs model continuous functions that e…
Tilt-based Aberration Estimation in Transmission Electron Microscopy
Jilles S. van Hulst, Erik M. Franken, Bart J. Janssen +2
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality.…
A Unified Family-optimal Solution to Covariance Intersection Problems with Semidefinite Programming
Leonardo Pedroso, W. P. M. H. Heemels, Pedro Batista
Covariance intersection (CI) methods provide a principled approach to fusing estimates with unknown cross-correlations by minimizing a worst-case measure of uncertainty that is con…
Bridging the Simulation-to-Reality Gap in Electron Microscope Calibration via VAE-EM Estimation
Jilles S. van Hulst, W. P. M. H. Heemels, Duarte J. Antunes
Electron microscopy has enabled many scientific breakthroughs across multiple fields. A key challenge is the tuning of microscope parameters based on images to overcome optical abe…