26 citations · 65 across the 6 of their papers we have counts for
6 papers
Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Akshay Agarwal, Leila Kasaei, Xinglin He +6
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam…
Continuous-Time Modeling and Analysis of Particle Beam Metrology
Akshay Agarwal, Minxu Peng, Vivek K. Goyal
Particle beam microscopy (PBM) performs nanoscale imaging by pixelwise capture of scalar values representing noisy measurements of the response from secondary electrons (SEs) integ…
Denoising Particle Beam Micrographs with Plug-and-Play Methods
Minxu Peng, Ruangrawee Kitichotkul, Sheila W. Seidel +2
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed…
Online Beam Current Estimation in Particle Beam Microscopy
Sheila W. Seidel, Luisa Watkins, Minxu Peng +3
In conventional particle beam microscopy, knowledge of the beam current is essential for accurate micrograph formation and sample milling. This generally necessitates offline calib…
Time-Resolved Focused Ion Beam Microscopy: Modeling, Estimation Methods, and Analyses
Minxu Peng, John Murray-Bruce, Vivek K Goyal
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a mi…
Source Shot Noise Mitigation in Focused Ion Beam Microscopy by Time-Resolved Measurement
Minxu Peng, John Murray-Bruce, Karl K. Berggren +1
Focused ion beam (FIB) microscopy suffers from source shot noise - random variation in the number of incident ions in any fixed dwell time - along with random variation in the numb…