26 citations · 65 across the 6 of their papers we have counts for
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physics.med-ph2023★ 5 cited
Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Akshay Agarwal, Leila Kasaei, Xinglin He +6
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam…
physics.data-an2023★ 6 cited
Continuous-Time Modeling and Analysis of Particle Beam Metrology
Akshay Agarwal, Minxu Peng, Vivek K. Goyal
Particle beam microscopy (PBM) performs nanoscale imaging by pixelwise capture of scalar values representing noisy measurements of the response from secondary electrons (SEs) integ…