26 citations · 65 across the 6 of their papers we have counts for
4 papers · 1 filter
Shot noise-mitigated secondary electron imaging with ion count-aided microscopy
Akshay Agarwal, Leila Kasaei, Xinglin He +6
Modern science is dependent on imaging on the nanoscale, often achieved through processes that detect secondary electrons created by a highly focused incident charged particle beam…
Denoising Particle Beam Micrographs with Plug-and-Play Methods
Minxu Peng, Ruangrawee Kitichotkul, Sheila W. Seidel +2
In a particle beam microscope, a raster-scanned focused beam of particles interacts with a sample to generate a secondary electron (SE) signal pixel by pixel. Conventionally formed…
Online Beam Current Estimation in Particle Beam Microscopy
Sheila W. Seidel, Luisa Watkins, Minxu Peng +3
In conventional particle beam microscopy, knowledge of the beam current is essential for accurate micrograph formation and sample milling. This generally necessitates offline calib…
Time-Resolved Focused Ion Beam Microscopy: Modeling, Estimation Methods, and Analyses
Minxu Peng, John Murray-Bruce, Vivek K Goyal
In a focused ion beam (FIB) microscope, source particles interact with a small volume of a sample to generate secondary electrons that are detected, pixel by pixel, to produce a mi…